The Right Tips for Your Probing Needs

Precision is the name of the game with atomic force microscope probes, and you can’t trust that to just any product out there. You need the right tip for the project and you need to feel confident what you use is going to gain you accurate results every single time. Look for products that are well made and from a company with a remarkable reputation.

The information you strive to collect through atomic force microscope probes is too important to leave it up to chance. You have to be in complete control over the testing, the variables, and the techniques. This means you have to know and trust the equipment and how it is set up. You also need to be skilled with how to use it successfully for your given project.

Point Probe

The most common type of tip used is the Point Probe. It offers diversity and it is simple to use compared to some of the other choices relating to atomic force microscope probes. They are used both for SPM and AFM testing. They are the best choice for high resolution types of evaluations. They are offered with a radius for the tip ranging from 8 nm to 12 nm.

You will also find them offered with various tip shapes. This is important as it allows you to customize the design you will use for a given project or a certain type of object. Understanding the variety you have and the best practices allows you to get the most use and overall results from this type of tip option.

Ultra Short

There may be times when you require an ultra-short tip for a given project. They are a good choice for high speed AFM options. The frequencies range from 1.2 MHz to 5 MHz. The tip radius is going to be less than 10 nm.

Pyrex Nitride

The use of such atomic force microscope probes as the Pyrex Nitride are less common, but still good to know about in case you have a need. They work for both contact and dynamic modes of probing. They offer both triangle and rectangle designs for your needs. You can get a version of this probe without a tip too.

Arrow

For very specific and in depth options, you can rely on Arrow atomic force microscope probes to get the job done. Crystal planes are used to offer a three-sided tip for you to maximize where you place it and what you use for a given object. The complex part though may be understanding what to use when with this type of option.

It is ideal when you are engaged with symmetrical elements in scans though. This is due to the specialized tip that is offered. The tip radius ranges from 10 nm to 15 nm. There is a high speed version available if you need a resonance frequency up to 2 MHz.

Inspections

Always inspect the tips routinely to verify they remain sharp. When they become dull, they can be compromised with the data they return. You will need to change them when they start to become dull. It is important to keep a log of when they are inspected and when they are changed. Such attention to detail will help you to get the most value from atomic force microscope probes.

There are plenty of options for you to get the ultimate results you seek. Identifying what to use, how to use it, and making sure it is in the best condition for use allows you to be successful. Don’t leave anything up to chance, focus on precision and promoting the best possible outcomes that are also objective and can be repeated.